1P199 Binary mixtures of ganglioside GM3 and SOPC studied by x-ray diffraction
نویسندگان
چکیده
منابع مشابه
Glass Studied by Neutron and X-Ray Diffraction
The short-range order of K P 0 3 glass has been studied by diffraction methods in order to make evident the different behaviour of the P-O bonds within the P 0 4 tetrahedron. The oxygen sites are devided into bridging and terminal (non-bridging) oxygen sites, corresponding to two P 0 bond lengths, the difference of which amounts to 14.5 pm. Previous conclusions about the changes of the P 0 bond...
متن کاملDeformation in Metallic Glasses Studied by Synchrotron X-Ray Diffraction
High mechanical strength is one of the superior properties of metallic glasses which render them promising as a structural material. However, understanding the process of mechanical deformation in strongly disordered matter, such as metallic glass, is exceedingly difficult because even an effort to describe the structure qualitatively is hampered by the absence of crystalline periodicity. In sp...
متن کاملSurface Hardness Measurment and Microstructural Characterisation of Steel by X-Ray Diffraction Profile Analysis
An X-ray diffraction line will broaden considerably when steels change into martensitic structure on quenching. The results presented in this paper show that X-ray diffraction technique can be employed for a rapid and nondestructive measurement of hardness of hardened steel. Measurement on various quenched and tempered steels showed that the breadth of its diffraction peak increased with increa...
متن کاملEVALUATION OFDISLOCATION STRUCTURE AND CRYSTALLITE SIZE IN WORN AL-SI ALLOY BY X-RAY DIFFRACTION
Abstract: powerful method for the characterization of microstructures of crystalline materials in terms of crystallite size anddislocation structures. In this paper the effect of the sliding on the microstructure of A356 in the as-cast and heattreated conditions are studied, The X-ray phase analysis shows that with increasing applied load, the dislocationdensity is increased, whereas the crysta...
متن کاملNano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Seibutsu Butsuri
سال: 2004
ISSN: 0582-4052,1347-4219
DOI: 10.2142/biophys.44.s79_3